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AWARDS AND ACCOLADES
- Listed Amongst Top 2% Highly-Cited Researchers by Stanford University.
:: In the “Applied Physics” category, rated as 98.14th percentile, amongst 269,833 researchers.
:: Only 2 of the 24 recipients from SUTD belong to the Assistant Professor category.
:: Junior-most faculty in the EPD Pillar to receive this recognition.
- IEEE Access Electronics Packaging Society Section Editor’s Highlight Article (2021).
:: For research paper on “Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages using Markov Chain Monte Carlo and Finite Element Analysis”. The work was an output of the PhD candidate, Cheryl Selvanayagam.
- IEEE Access Reliability Society Section Editor’s Highlight Article (2021).
:: For research paper on “Bias Suppression Framework for Detrending Mean of Multi-Output Gaussian Process Regression in LED Remaining Storage Life Prognosis”. The work was an output of the PhD candidate, Lim Hze Li Harry.
- ECTC 2020 Best Student Paper Travel Award (2020).
:: For paper presented on learning of localized spatial material properties of substrates in ultra-thin packages using Markov Chain Monte Carlo and Finite Element Analysis at ECTC 2020 held at Florida, USA. Award is given to my student, Ms. Cheryl Selvanayagam.
- MDPI Electronics Editor’s Highlight Article (2020).
:: For paper presented on “Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks”. The article was one of the 16 papers chosen from 550 articles for this recognition.
- IEEE IRPS Best Paper Award (2019).
:: For paper presented on spatio-temporal modeling of defect generation in high permittivity dielectric stacks at IRPS 2019 held at Monterey, CA, USA.
- IEEE Electron Device Society Early Career Award (2016) – US$1000.
:: This award is given to one young scientist every year by the EDS Society.
- IEEE Electron Device Society PhD Fellowship Award (2011) – US$5000.
:: This award is given only to 3 doctoral students world over each year.
:: Only Asia-Pacific recipient of this award.
- IEEE Reliability Society Graduate Scholarship Award (2008) – US$2000.
:: This award is given only to 5 budding reliability researchers world over each year.
- Best Student Paper Award at INFOS 2013 Symposium held at Krakow, Poland.
- SUTD-MIT Joint Post-Doctoral Fellowship (PDF) – (2013 – 2015).
- Katholieke Universiteit Leuven - Post-Doctoral Fellowship (PDF), (2012 - 2013).
- “International Scholar” Research Fund, Katholieke Universiteit Leuven, (Feb - Sept 2012).
- UNSW Science Fellowship Writing Scheme Award (DECRA) (2011).
- NTU Research Student Scholarship (RSS) for Doctoral Studies (2009-2012).
- Singapore-MIT Alliance (SMA) Graduate Fellowship 2007-08.
- Chosen as candidate for inclusion in MARQUIS “Who’s Who in the World®” 2009 Edition.
- NTU President’s Research Scholar Award 2004-05, 2005-06.
- Nanyang Scholarship Award 2003-07.
EDITORIAL DUTIES
IEEE Access (Associate Editor) – Since 2018.
Elsevier – Microelectronic Engineering – (Associate Editor) - Since 2022.
MDPI Electronics – Editor – 2020 – 2023.
Journal of Prognostics and Health Management (JPHM) – Associate Editor – Since 2018.
Elsevier - Microelectronics Reliability (Guest Associate Editor – IPFA 2019 / 2020 / 2021 Special Issue).
Frontiers in Neuroscience (2021) – (Special Issue Editor) Memristive Materials for Spike-based Computing
IEEE Journal of the Electron Device Society (J-EDS) (Special Issue Editor) – EDTM 2019.
CONFERENCE COMMITTEES AND ROLES
Organizing Committee Member Roles
- Short Course Session Chair, EDTM 2022, Oita, Japan.
- Paper Review Chair, PHM 2022, London, UK.
- Asia Liaison Chair, IIRW 2022, California, USA.
- Paper Review Co-Chair, AMBW 2022, SUTD, Singapore.
- Chair for “Reliability Physics of Semiconductor Devices” Track – IEEE ICEE 2022, Bangalore, India.
- Publicity Co-Chair and Logic Device Reliability Track Co-Chair – IPFA 2022, Singapore.
- General Chair, IPFA 2021 (Virtual), Singapore.
- General Chair, IPFA 2020 (Virtual), Singapore.
- Asia Liaison Publicity Chair, IIRW 2020, Lake Tahoe, California.
- General Co-Chair, IPFA 2019, Hangzhou, China
- Technical Program Chair, INEC 2019, Kuching, Malaysia.
- Tutorial (Short Course) Chair, EDTM 2019, Singapore.
- Asia Liaison Publicity Chair, IIRW 2019, Lake Tahoe, California.
- FEOL-BEOL Dielectric Committee Chair, IRPS 2018, San Francisco, CA, USA.
- Technical Program Chair, IPFA 2018, Marina Bay Sands, Singapore.
- Organizing Committee Member, ChinaRRAM Workshop, Suzhou, China.
- FEOL-BEOL Dielectric Committee Co-Chair, IRPS 2017, Monterey, CA, USA.
- Technical Program Co-Chair, IPFA 2017, Chengdu, China.
- Technical Program Co-Chair, IPFA 2016, Singapore.
- Co-Chair – Front-End-of-Line (FEOL) Reliability Committee, IPFA 2016, Singapore.
- Organizing Committee Member, IPFA 2014, Singapore.
- Co-Chair – Front-End-of-Line (FEOL) Reliability Committee, IPFA 2014, Singapore.
- Organizing Committee Member, IEEE PHM 2016, Ottawa, Canada.
Technical Program Review Committee Member Roles
- IEEE Electron Device and Technology Manufacturing Conference (EDTM 2023), Seoul, S. Korea.
- IEEE International Reliability Physics Symposium (IRPS 2023), Monterey, CA, USA.
- IEEE International Integrated Reliability Workshop (IIRW 2022), Lake Tahoe, CA, USA.
- IEEE International Reliability Physics Symposium (IRPS 2022), Dallas, TX, USA.
- IEEE International Reliability Physics Symposium (IRPS 2021), Dallas, TX, USA.
- IEEE International Reliability Physics Symposium (IRPS 2020), Dallas, TX, USA.
- European Symposium on Reliability of Electron Devices, (ESREF 2019), Toulouse, France.
- IEEE International Reliability Physics Symposium (IRPS 2019), Monterey, CA, USA.
- IEEE Prognostics and Health Management Conference (PHM 2019), San Francisco, USA.
- European Symposium on Reliability of Electron Devices, (ESREF 2018), Aalborg, Denmark.
- IEEE International Reliability Physics Symposium (IRPS 2018), Burlingame, CA, USA.
- IEEE International Integrated Reliability Workshop (IIRW 2017), Lake Tahoe, CA, USA.
- European Symposium on Reliability of Electron Devices, (ESREF 2017), Bordeaux, France.
- IEEE Prognostics and Health Management Conference (PHM 2017), Dallas, Texas, USA.
- Prognostics and Health Management (PHM) Conference, PHM Harbin 2017.
- IEEE International Reliability Physics Symposium (IRPS 2017), Monterey, CA, USA.
· FEOL-MOL-BEOL Dielectrics Committee.
· Transistors / Beyond CMOS Committee.
· Memory / Product Technology Committee.
- IEEE Prognostics and Health Management (PHM) Conference, 2016, Ottawa, Canada.
- IEEE International Integrated Reliability Workshop (IIRW 2016), Lake Tahoe, CA, USA.
- European Symposium on Reliability of Electron Devices, (ESREF 2016), Halle, Germany.
- IEEE International Reliability Physics Symposium (IRPS 2016), Pasadena, CA, USA.
- European Symposium on Reliability of Electron Devices, (ESREF 2015), Toulouse, France.
- IEEE International Integrated Reliability Workshop (IIRW 2015), Lake Tahoe, CA, USA.
- IEEE International Integrated Reliability Workshop (IIRW 2014), Lake Tahoe, CA, USA.
- IEEE International Symposium on Integrated Circuits (ISIC 2014), Singapore.
- IEEE Conference on Prognostics and Health Management (PHM 2014), Washington, USA.
- IEEE International Reliability Physics Symposium (IRPS 2014), Waikoloa, Hawaii, USA.
- IEEE International Integrated Reliability Workshop (IIRW 2013), Lake Tahoe, CA, USA.
- International Semiconductor Device Research Symposium (ISDRS 2013), Maryland, USA.
- European Symposium on Reliability of Electron Devices, (ESREF 2013), Arcachon, France.
- IEEE Symposium on the Physical and Failure Analysis of ICs (IPFA 2013), Suzhou, China.
- IEEE Reliability Science for Adv. Materials and Devices, (RSAMD 2013), Colorado, USA.
- IEEE International Integrated Reliability Workshop (IIRW 2012), Lake Tahoe, CA, USA.
- European Symposium on Reliability of Electron Devices, (ESREF 2012), Sardinia, Italy.
- IEEE Symposium on the Physical and Failure Analysis of ICs (IPFA 2012), Singapore.
- European Symposium on Reliability of Electron Devices, (ESREF 2011), Bordeaux, France.
- IEEE International Integrated Reliability Workshop (IIRW 2011), Lake Tahoe, CA, USA.
- International Semiconductor Device Research Symposium (ISDRS 2011), Maryland, USA.
PROFESSIONAL MEMBERSHIPS
- Member of IEEE (MIEEE) and EDS Society – 17th Year - (2005 - Present).
- Associate Member – American Society for Quality (ASQ) – 2016-2018.
- Nominated Member of EDS GOLD Committee (3-year Term: 2012-2014).
- Student Member – Materials Research Society (MRS), (2008 – 2012).
- Member of Electrochemical Society (ECS), (2008 – 2012).
- Past Member - IEEE Reliability Society (RS) (2016-2018).
TUTORIALS
- “Physics Informed Prognosis for Remaining Life Prediction” – IEEE Prognostics and Health Management Conference (PHM 2020), 24 October 2020, Jinan, China.
- “Physics of Failure Approach to Prognosis” – IEEE Prognostics and Health Management Conference (PHM 2017), 09 July 2017, Harbin, China.
- “Performance and Reliability Trade-Offs of High-κ RRAM” - 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2014), Guilin, China.
INVITED TALKS
RESEARCH TALKS
- “AI-Enabled Modeling and Simulation of Semiconductor Devices”, Vaibhav Summit, Government of India, IIT Kanpur, Oct 19, 2020.
- “Reliability Prediction of Current and Future Nanoelectronic Devices – Trends and Challenges”, Virtual International Transdisciplinary Conference (VIT-C), Vellore, India, August 26, 2020.
- “AI-Assisted Package Design for Improved Warpage Control of Ultra-Thin Packages”, 2020 IEEE 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Session Keynote Talk – July 5, 2020.
- “Reliability Prediction of Current and Future Nanoelectronic Devices – Trends and Challenges”, CGU International Industrial Reliability Workshop (IIRW), Taoyuan, Taiwan, April 30, 2019.
- “Evolution of the Physics and Stochastics of Failure in Ultra-Thin Dielectrics – From SiO2 to Advanced High-κ Gate Stacks”, IEEE International Nanoelectronics Conference (INEC), Kuala Lumpur, Malaysia, January 5, 2018.
- “Challenges in Reliability Assessment of Advanced High-κ Dielectric Stacks”, Taiwan ESD and Reliability Conference (TESDC), National Chiao Tung University (NCTU), Hsinchu, Taiwan, November 02, 2017.
- “Physical Origin of the Defect Clustering Model in Nanoelectronic Logic and Memory Devices”, IEEE Electron Device and Solid State Circuits Conference (EDSSC), NTHU, Hsinchu, Taiwan, October 18, 2017.
- “Variability Reduction in Nanoscale Additive Manufacturing Processes – A Statistical – Physical Perspective”, 1st Singapore – MERLION Nanoscale 3D Printing Workshop, SUTD, December 1, 2016.
- "Performance and Reliability Trade-Offs of High-κ RRAM" - 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2014 – Organized by Technische Universität Berlin (TUB), Berlin, Germany - Sept 30 – Oct 2, 2014.
- “Resistive Switching Memory Devices for High Density Data Storage – Performance and Reliability Trade-Offs” – Invited Seminar Talk – June 19, 2014 – University of Liege (ULg), Montefiore Institute, Sart-Tilman, Liege, Belgium.
- “Low energy nanoelectronics – Performance and Reliability Trade-Offs” - Invited Seminar Talk – May 12, 2014 – King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia.
- "Understanding the Physics of Resistance Switching and Failure Mechanisms in Aggressively Scaled RRAM Devices" - Invited Delegate Speaker - Dec 10, 2013 – International Workshop on the Physics on Semiconductor Devices (IWPSD), 2013 – Organized by Semiconductor Society of India, Amity University, New Delhi, India.
- "Reliability and Failure Mechanisms in High-κ Gate Stacks and the Use of Prognostics for Transistor Degradation Monitoring" - Seminar Talk - Dec 5, 2011 - Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USA.
- "Metal Gate High-κ Dielectric Logic Stacks - Reliability Characterization and Resistive Switching Applications" - Seminar Talk - Dec 2, 2011 - National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, USA.
- "Design for Manufacturability, Reliability and Maintainability - Opportunities, Challenges & Applications" - Seminar Talk - Sept 9, 2011 - Singapore - MIT International Design Center (IDC), Dover Road, Singapore.
- "High-κ Dielectric Logic Gate Stacks - Reliability Characterization and Effective Tool to Decode the Switching Mechanism in RRAM" - Visiting Research Student Talk - Interuniversity Microelectronics Center (IMEC), Leuven, Belgium - June 29, 2011.
- "High-κ Dielectric Breakdown in Silicon CMOS - Electrical, Physical and Statistical Perspective" - Visiting Research Student - University of Modena and Reggio Emilia, Italy - June 26 - 27, 2011.
- "Can a MOSFET survive from multiple breakdowns?" - 20th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2009 – Organized by University of Bordeaux, France.
INDUSTRY TALKS
- "Ensuring Reliability for Future Semiconductor Technology and Leveraging on Variability for New Applications" – SCS Technical Innovation Symposium, STATSChipPAC® – Republic Polytechnic, Singapore, September 5, 2016.
EDUCATIONAL TALKS
- "Design for a Better World – Design Thinking for Products, Services and Systems" – Jurong Pioneer Junior College (JPJC), Alumni Series Talk, Singapore, March 29th, 2022.
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